Polishing Rate and Dependent Factors of Copper in CeO2 Slurry Containing KIO3 during CMP
           
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DOI:doi:10.3969/j.issn.1007-7545.年份.期号.顺序号
KeyWord:CMP;CeO2
HU Jian-dong,LI Yong-xiu,ZHOU Xue-zhen
1 School of Science and Technology of Material, Nanchang University, Nanchang 330031, China; 2. School of Science, Nanchang University, Nanchang 330047, China
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